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Tip-enhanced resonance Raman spectroscopy (TERRS) has been demonstrated by a research team at Fritz-Haber Institute. The results suggest that TERRS could offer a new approach for the atomic-scale optical characterization of local electronic states.
The researchers demonstrated TERRS on ultrathin zinc oxide layers epitaxially grown on a Ag(111) surface in which both physical and chemical enhancement mechanisms were operative. The underlying process was examined by modifying the localized surface plasmon resonance in a scanning tunneling microscope junction and recording different-thickness zinc oxide films that exhibited a slightly different electronic structure.
Tip-enhanced resonance Raman scattering is measured by a silver…READ MORE