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Today, the most common optical technique for imaging and measurement of thermal conductivity of semiconductors is time-domain thermoreflectance (TDTR), in which a femtosecond pump pulse is used to heat up the sample through a metal film. While widely adopted, the difficulties are well known. Besides the expensive femtosecond lasers, the samples have to be polished to provide a clean, flat surface for a controlled thermal contact with the metal film, so TDTR is invasive and requires careful sample preparation.
To overcome these shortcomings, a joint research group from University of Electronic Science and Technology of China, University of Houston, Sichuan University, and Baylor University developed a nondestructive k measurement…READ MORE