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    Quantum Dot Microscope Can Measure Electric Surface Potentials of Single Atoms

    Article obtained from Photonics RSS Feed.

    A new scanning quantum dot microscopy method can measure the electric potential of a sample at atomic accuracy. It was developed by a team from Forschungszentrum Jülich, working with researchers from two other institutions. The new technique has potential application for chip manufacturing and the characterization of biomolecules.

    A quantum dot was attached to the tip of an atomic force microscope (AFM) to serve as a noncontact scanning probe. The quantum dot was so small that individual electrons from the tip of the AFM could be attached to it in a controlled manner. The quantum dot sensor and the joint electrostatic screening by tip and surface enabled quantitative surface potential imaging across all length scales down to…

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    Jun, 18 2019 |

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