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As new materials emerge, thermal conductivity measurements will need to be developed to handle materials with a small size and high thermal conductivity (k).
A joint research group has developed two new optical techniques — photoluminescence mapping (PL-mapping) and time-domain thermo-photoluminescence (TDTP) — that provide rapid, nondestructive characterization of k in materials and that require minimal sample preparation. PL-mapping and TDTP could provide new tools for further development of semiconductor-based high-k materials, according to the team of scientists from Baylor University, the University of Electronic Science and Technology of China, the University of Houston, and Sichuan University.
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