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Researchers from the College of Advanced Interdisciplinary Studies at the National University of Defense Technology developed a vacuum ultraviolet (VUV) laser system for scanning photoemission microscopy. The 177-nm VUV system was developed with a focal spot of less than 1 μm at a long focal length of approximately 45 mm using a spherical aberration-free zone plate.
Based on the setup, the team also developed an off-axis fluorescence detection platform that exhibits substantial capability in revealing subtle features of quantum materials when compared to conventional laser systems.
The system is well suited for the evaluation of electronic structures of 2D quantum materials such as twisted bilayer graphene, monolayer copper…READ MORE