Imaging Method Peers Within Semiconductor Structures - IDEX Health & ScienceIDEX Health & Science

    Disclaimer:

    The views, information, or opinions expressed in the Industry News RSS feed belong solely to the author and do not necessarily represent those of IDEX Health & Science and its employees.

    Imaging Method Peers Within Semiconductor Structures

    Article obtained from Photonics RSS Feed.

    Researchers from the University of Jena have developed a method called coherence tomography with extreme ultraviolet light (XCT). The technique, which has applications in materials research and data processing, enables the study of the interior structures of semiconductor materials in a nondestructive way.

    The imaging method is based on the operational principles of optical coherence tomography (OCT), an established imaging method in areas such as ophthalmology, doctoral candidate Felix Wiesner said. “These devices have been developed to examine the retina of the eye noninvasively, layer by layer, to create three-dimensional images.”
    Professor Gerhard Paulus, Ph.D. student Felix Wiesner, and Dr. Silvio Fuchs (from…

    READ MORE
    Feb, 18 2021 |

    IDEX Health & Science is the global authority in fluidics and optics, bringing to life advanced optofluidic technologies with our products, people, and engineering expertise. Intelligent solutions for life.