Optical Specifications
|
Value |
Transmission Band 1
|
Tavg > 93% 1022 – 2100 nm over any 10 nm window |
Transmission Band 1 (p-pol)
|
Tavg > 95% 992 – 2100 nm |
Transmission Band 1 (s-pol)
|
Tavg > 90% 1022 – 2100 nm |
Reflection Band 1
|
Ravg > 95% 770 – 938 nm over any 10 nm window |
Reflection Band 1 (p-pol)
|
Ravg > 90% 770 – 930 nm |
Reflection Band 1 (s-pol)
|
Ravg > 98% 770 – 968 nm |
Edge Wavelength 1
|
980 nm |
General Filter Specifications
|
Value |
Angle of Incidence
|
45 ± 1.5 degrees |
Cone Half-angle
|
2 degrees |
Optical Damage Rating
|
50 mJ/cm² @ 800 nm (50 fs pulse width); test pending; specification based on FS01 Mirror test results |
Flatness / RWE Classification
|
Super-resolution / TIRF |
Transmitted Wavefront Error
|
λ/10 PV over CA @ 632.8 nm |
Reflected Wavefront Error
|
< 1λ P-V RWE @ 632.8 nm |
Steepness
|
Standard |
Group Delay Dispersion Reflection (p-pol) 1
|
± 100 fs² over 771 - 911 nm |
Group Delay Dispersion Transmission (p-pol) 1
|
± 100 fs² over 1020 - 2050 nm (excluding substrate, by design) |
Group Delay Dispersion Reflection (p-pol) 2
|
± 500 fs² over 757 - 933 nm |
Group Delay Dispersion Transmission (p-pol) 2
|
± 500 fs² over 1000 - 2100 nm (excluding substrate, by design) |
Group Delay Dispersion Reflection (s-pol) 2
|
± 500 fs² over 751 - 970 nm |
Group Delay Dispersion Transmission (s-pol) 2
|
± 500 fs² over 1038 - 2100 nm (excluding substrate, by design) |
Physical Filter Specifications
|
Value |
Transverse Dimensions (L x W)
|
25.2 mm x 35.6 mm |
Transverse Tolerance
|
± 0.1 mm |
Clear Aperture
|
≥ 85% (elliptical) |
Scratch-Dig
|
60-40 |
Substrate Type
|
Fused Silica |
Filter Thickness (unmounted)
|
1.05 mm |
Filter Thickness Tolerance (unmounted)
|
± 0.05 mm |
Orientation
|
Reflective surface marked with laser dot - Orient in direction of incoming light |