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980 nm BrightLine® Multiphoton LaserMUX Beam Combiner

Semrock Part Number: FF980-Di01-t1-25x36

IDEX Part Number: FL-007071  /

Semrock
Multiphoton LaserMUXâ„¢ beam combiners enable deeper tissue imaging and improved contrast in multi-color and multi-modal fluorescence microscopy. The filters set new performance standards by simultaneously achieving high transmission, high reflection, and low GDD over both reflection & transmission, while maintaining minimal wavefront distortion. Ideal for combining two femtosecond pulsed laser beams, they are perfect for optogenetics and other life science applications.

Combine two or more femtosecond pulsed lasers such as Ti:Sapphire (& OPO coupled), neodymium and ytterbium-doped fiber and glass lasers, and Cr-forsterite lasers.

< 1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
< λ/10 P-V Transmitted Wavefront Error
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  • Price Not Available.
  • 790.00 USD Each
    US Domestic pricing – contact your local distributor for other currency list prices
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Optical Specifications Value
Transmission Band 1 Tavg > 93% 1022 – 2100 nm over any 10 nm window
Transmission Band 1 (p-pol) Tavg > 95% 992 – 2100 nm
Transmission Band 1 (s-pol) Tavg > 90% 1022 – 2100 nm
Reflection Band 1 Ravg > 95% 770 – 938 nm over any 10 nm window
Reflection Band 1 (p-pol) Ravg > 90% 770 – 930 nm
Reflection Band 1 (s-pol) Ravg > 98% 770 – 968 nm
Edge Wavelength 1 980 nm
General Filter Specifications Value
Angle of Incidence 45 ± 1.5 degrees
Cone Half-angle 2 degrees
Optical Damage Rating 50 mJ/cm² @ 800 nm (50 fs pulse width); test pending; specification based on FS01 Mirror test results
Flatness / RWE Classification   Super-resolution / TIRF
Transmitted Wavefront Error λ/10 PV over CA @ 632.8 nm
Reflected Wavefront Error < 1λ P-V RWE @ 632.8 nm
Steepness Standard
Group Delay Dispersion Reflection (p-pol) 1 ± 100 fs² over 771 - 911 nm
Group Delay Dispersion Transmission (p-pol) 1 ± 100 fs² over 1020 - 2050 nm (excluding substrate, by design)
Group Delay Dispersion Reflection (p-pol) 2 ± 500 fs² over 757 - 933 nm
Group Delay Dispersion Transmission (p-pol) 2 ± 500 fs² over 1000 - 2100 nm (excluding substrate, by design)
Group Delay Dispersion Reflection (s-pol) 2 ± 500 fs² over 751 - 970 nm
Group Delay Dispersion Transmission (s-pol) 2 ± 500 fs² over 1038 - 2100 nm (excluding substrate, by design)
Physical Filter Specifications   Value
Transverse Dimensions (L x W) 25.2 mm x 35.6 mm
Transverse Tolerance ± 0.1 mm
Clear Aperture ≥ 85% (elliptical)
Scratch-Dig 60-40
Substrate Type Fused Silica
Filter Thickness (unmounted) 1.05 mm
Filter Thickness Tolerance (unmounted) ± 0.05 mm
Orientation Reflective surface marked with laser dot - Orient in direction of incoming light

FF850-Di01-t1-25x36

FL-006983 / 0

Out of Stock Backordered In Stock
  • Multiphoton laser beam combiner with edge at 850 nm
  • Ravg > 95% 670 – 815 nm
  • Tavg > 93% 890 – 2100 nm
  • < 1/10 wave P-V Transmitted Wavefront Error
  • < ± 100 fs² Group Delay Dispersion over popular femtosecond laser wavelengths
  • Flatness / RWE: Super-resolution / TIRF 

 

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Specifications

FF850-Di01-t1-25x36

FL-006983 / 0

Out of Stock Backordered In Stock
  • Multiphoton laser beam combiner with edge at 850 nm
  • Ravg > 95% 670 – 815 nm
  • Tavg > 93% 890 – 2100 nm
  • < 1/10 wave P-V Transmitted Wavefront Error
  • < ± 100 fs² Group Delay Dispersion over popular femtosecond laser wavelengths
  • Flatness / RWE: Super-resolution / TIRF 

 

1 of 1