835 nm BrightLine^® multiphoton 3P short-pass super-resolution / TIRF dichroic beamsplitter

Semrock Part Number: FF835-SDi01-t3-25x36

IDEX Part Number: FL-413703 /

Specifications

Optical Specifications	Value
Transmission Band 1	Tavg > 90% 400 – 820 nm
Transmission Band 2	Tavg > 80% 400 – 420 nm (Rolling Window: 10 nm)
Transmission Band 3	Tavg > 90% 420 – 820 nm (Rolling Window: 10 nm)
Reflection Band 1	Ravg > 94% 1200 – 1350 nm
Reflection Band 1 (p-pol)	Ravg > 90% 1200 – 1350 nm
Reflection Band 1 (s-pol)	Ravg > 98% 1200 – 1350 nm
Reflection Band 2	Ravg > 94% 1600 – 1870 nm
Reflection Band 2 (p-pol)	Ravg > 90% 1600 – 1870 nm
Reflection Band 2 (s-pol)	Ravg > 98% 1600 – 1870 nm
Edge Wavelength 1	835 nm
Laser Wavelengths 1	1200 - 1350 nm
Laser Wavelengths 2	1600 - 1870 nm
General Filter Specifications	Value
Angle of Incidence	45 ± 1.5 degrees
Cone Half-angle	2 degrees
Optical Damage Rating	1 J/cm² @ 532 nm (10 ns pulse width)
Flatness / RWE Classification	Super-resolution / TIRF
Maximum Reflected Laser Beam Diameter	16.7 mm
Nominal Flatness	< 0.19λ P-V per inch @ 632.8 nm
Reflected Wavefront Error	< 0.33λ P-V RWE @ 632.8 nm
Steepness	Standard
Group Delay Dispersion 1	± 1500 fs² over 1200 - 1350 nm refl band for S-Pol and P-Pol
Group Delay Dispersion 2	± 750 fs² over 1600 - 1870 nm refl band for S-Pol and P-Pol
Physical Filter Specifications	Value
Transverse Dimensions (L x W)	25.2 mm x 35.6 mm
Transverse Tolerance	± 0.1 mm
Clear Aperture	≥ 80% (elliptical)
Scratch-Dig	60-40
Substrate Type	Fused Silica
Filter Thickness (unmounted)	3.0 mm
Filter Thickness Tolerance (unmounted)	± 0.1 mm
Orientation	Reflective surface marked with laser dot - Orient in direction of incoming light

Optical Specifications: Value
Transmission Band 1: Tavg > 90% 400 – 820 nm
Transmission Band 2: Tavg > 80% 400 – 420 nm (Rolling Window: 10 nm)
Transmission Band 3: Tavg > 90% 420 – 820 nm (Rolling Window: 10 nm)
Reflection Band 1: Ravg > 94% 1200 – 1350 nm
Reflection Band 1 (p-pol): Ravg > 90% 1200 – 1350 nm
Reflection Band 1 (s-pol): Ravg > 98% 1200 – 1350 nm
Reflection Band 2: Ravg > 94% 1600 – 1870 nm
Reflection Band 2 (p-pol): Ravg > 90% 1600 – 1870 nm
Reflection Band 2 (s-pol): Ravg > 98% 1600 – 1870 nm
Edge Wavelength 1: 835 nm
Laser Wavelengths 1: 1200 - 1350 nm
Laser Wavelengths 2: 1600 - 1870 nm
General Filter Specifications: Value
Angle of Incidence: 45 ± 1.5 degrees
Cone Half-angle: 2 degrees
Optical Damage Rating: 1 J/cm² @ 532 nm (10 ns pulse width)
Flatness / RWE Classification: Super-resolution / TIRF
Maximum Reflected Laser Beam Diameter: 16.7 mm
Nominal Flatness: < 0.19λ P-V per inch @ 632.8 nm
Reflected Wavefront Error: < 0.33λ P-V RWE @ 632.8 nm
Steepness: Standard
Group Delay Dispersion 1: ± 1500 fs² over 1200 - 1350 nm refl band for S-Pol and P-Pol
Group Delay Dispersion 2: ± 750 fs² over 1600 - 1870 nm refl band for S-Pol and P-Pol
Physical Filter Specifications: Value
Transverse Dimensions (L x W): 25.2 mm x 35.6 mm
Transverse Tolerance: ± 0.1 mm
Clear Aperture: ≥ 80% (elliptical)
Scratch-Dig: 60-40
Substrate Type: Fused Silica
Filter Thickness (unmounted): 3.0 mm
Filter Thickness Tolerance (unmounted): ± 0.1 mm
Orientation: Reflective surface marked with laser dot - Orient in direction of incoming light

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835 nm BrightLine^® multiphoton 3P short-pass super-resolution / TIRF dichroic beamsplitter

Specifications

Specifications

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835 nm BrightLine® multiphoton 3P short-pass super-resolution / TIRF dichroic beamsplitter

Specifications

Specifications

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835 nm BrightLine^® multiphoton 3P short-pass super-resolution / TIRF dichroic beamsplitter