785 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

Semrock Part Number: Di03-R785-t1-25x36

IDEX Part Number: FL-006971  /

Semrock
The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.

Semrock's super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.

1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
λ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE
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  • 660.00 USD Each
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Optical Specifications Value
Transmission Band 1 Tavg > 93% 804.3 – 1600 nm
Reflection Band 1 Rabs > 94% 780 – 790 nm
Reflection Band 1 (p-pol) Rabs > 90% 780 – 790 nm
Reflection Band 1 (s-pol) Rabs > 98% 780 – 790 nm
Reflection Band 2 Ravg > 90% 350 – 780 nm
Edge Wavelength 1 800 nm
Laser Wavelengths 1 780 nm, 785 nm, 790nm
General Filter Specifications Value
Angle of Incidence 45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle 0.5 degrees
Optical Damage Rating 1 J/cm² @ 532 nm (10 ns pulse width)
Flatness / RWE Classification   Super-resolution / TIRF
Reflected Wavefront Error < 1λ P-V RWE @ 632.8 nm
Steepness Steep
Physical Filter Specifications   Value
Transverse Dimensions (L x W) 25.2 mm x 35.6 mm
Transverse Tolerance ± 0.1 mm
Clear Aperture ≥ 80% (elliptical)
Scratch-Dig 60-40
Substrate Type Fused Silica
Filter Thickness (unmounted) 1.05 mm
Filter Thickness Tolerance (unmounted) ± 0.05 mm
Orientation Reflective surface marked with laser dot - Orient in direction of incoming light

LL01-785-12.5

FL-007933 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 785 nm
  • Tabs > 90% 785 nm
  • FWHM of 3.0 nm (typical); 5.5 nm (maximum)

BLP01-785R-25

FL-008534 / 0

Out of Stock Backordered In Stock
  • Filter with 50% edge at 805 nm
  • 309 cm-1 transition
  • Tavg > 93% from 812.9 – 1200 nm

NF03-785E-25

FL-009358 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 785 nm
  • Typical Notch Bandwidth = 39 nm
  • ODabs > 6 785 nm

FDi03-R785

FL-004827 / 0

Out of Stock Backordered In Stock

LPD02-785RU-25

FL-008049 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 785 nm
  • 126 cm-1 transition
  • Tavg > 93% 795.2 – 1213.8 nm
  • Flatness / RWE: Laser

LD01-785/10-12.5

FL-007686 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 785 nm
  • Tabs > 90% 780 – 790 nm
  • Center Wavelength of 785 nm and GMBW of 10 nm

NFD01-785-25x36

FL-009360 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 785 nm
  • R > 98% 785 nm
  • Tavg > 90% 350 – 749 nm & 841 – 1600 nm

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TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

Specifications