635 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

Semrock Part Number: Di03-R635-t1-25x36

IDEX Part Number: FL-006959  /

Semrock
The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.

Semrock's super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.

1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
λ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE
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  • Price Not Available.
  • 555.00 USD Each
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Optical Specifications Value
Transmission Band 1 Tavg > 93% 658.8 – 1200 nm
Reflection Band 1 Rabs > 94% 632.8 – 647.1 nm
Reflection Band 1 (p-pol) Rabs > 90% 632.8 – 647.1 nm
Reflection Band 1 (s-pol) Rabs > 98% 632.8 – 647.1 nm
Reflection Band 2 Ravg > 90% 350.0 – 632.8 nm
Edge Wavelength 1 655.8 nm
Laser Wavelengths 1 632.8 nm, 635 +7/-3 nm, 647.1 nm
General Filter Specifications Value
Angle of Incidence 45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle 0.5 degrees
Optical Damage Rating 1 J/cm² @ 532 nm (10 ns pulse width)
Reflected Wavefront Error < 1λ P-V RWE @ 632.8 nm
Steepness Steep
Flatness / RWE Classification   Super-resolution / TIRF
Physical Filter Specifications   Value
Transverse Dimensions (L x W) 25.2 mm x 35.6 mm
Transverse Tolerance ± 0.1 mm
Clear Aperture ≥ 80% (elliptical)
Scratch-Dig 60-40
Substrate Type Fused Silica
Filter Thickness (unmounted) 1.05 mm
Filter Thickness Tolerance (unmounted) ± 0.05 mm
Substrate Thickness Tolerance (1 mm, unmounted) ± 0.05 mm
Orientation Reflective surface marked with laser dot - Orient in direction of incoming light

FF01-640/14-25

FL-004697 / 0

Out of Stock Backordered In Stock
  • Tavg > 93% 633 – 647 nm
  • Center Wavelength of 640 nm and GMBW of 14 nm
  • FWHM of 20.2 nm

FF01-676/29-25

FL-004567 / 0

Out of Stock Backordered In Stock
  • Tavg > 90% 661 – 690 nm
  • Center Wavelength of 675.5 nm and GMBW of 29 nm
  • FWHM of 36.1 nm

LL01-633-12.5

FL-007932 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 632.8 nm
  • Tabs > 90% 632.8 nm
  • FWHM of 2.4 nm (typical); 4.4 nm (maximum)

LD01-640/8-12.5

FL-007698 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 640 nm
  • Tabs > 90% 636.3 – 644.3 nm
  • Center Wavelength of 640 nm and GMBW of 8 nm

BLP01-633R-25

FL-008543 / 0

Out of Stock Backordered In Stock
  • Filter with 50% edge at 645 nm
  • 385.4 cm-1 transition
  • Tavg > 93% from 650.5 – 1200 nm

BLP01-635R-25

FL-008533 / 0

Out of Stock Backordered In Stock
  • Filter with 50% edge at 655 nm
  • 380 cm-1 transition
  • Tavg > 93% from 660 – 1200 nm

NF03-633E-25

FL-009357 / 0

Out of Stock Backordered In Stock
  • Laser Wavelength = 632.8 nm
  • Typical Notch Bandwidth = 25 nm
  • ODabs > 6 632.8 nm

FDi03-R635

FL-004825 / 0

Out of Stock Backordered In Stock