594 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

Semrock Part Number: Di03-R594-t3-25x36

IDEX Part Number: FL-006988  /

Semrock
The perfect dichroic beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers for advanced microscopy. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.

Semrock's super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.

1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
λ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE
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  • Price Not Available.
  • 660.00 USD Each
    US Domestic pricing – contact your local distributor for other currency list prices
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Optical Specifications Value
Transmission Band 1 Tavg > 93% 605 – 1200 nm
Reflection Band 1 Rabs > 94% 593.5 – 594.3 nm
Reflection Band 1 (p-pol) Rabs > 90% 593.5 – 594.3 nm
Reflection Band 1 (s-pol) Rabs > 98% 593.5 – 594.3 nm
Reflection Band 2 Ravg > 90% 350 – 593.5 nm
Edge Wavelength 1 599.5 nm
Laser Wavelengths 1 593.5 nm, 594.1 nm, 594.0 +/- 0.3 nm
General Filter Specifications Value
Angle of Incidence 45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle 0.5 degrees
Optical Damage Rating 1 J/cm² @ 532 nm (10 ns pulse width)
Reflected Wavefront Error < 0.2λ P-V RWE @ 632.8 nm
Steepness Steep
Flatness / RWE Classification   Super-resolution / TIRF
Physical Filter Specifications   Value
Transverse Dimensions (L x W) 25.2 mm x 35.6 mm
Transverse Tolerance ± 0.1 mm
Clear Aperture ≥ 80% (elliptical)
Scratch-Dig 60-40
Substrate Type Fused Silica
Filter Thickness (unmounted) 3.0 mm
Filter Thickness Tolerance (unmounted) ± 0.1 mm
Orientation Reflective surface marked with laser dot - Orient in direction of incoming light

Specifications