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488/561 nm lasers BrightLine® dual-edge laser dichroic beamsplitter

Semrock Part Number: Di01-R488/561-25x36

IDEX Part Number: FL-006697  /

Semrock

Optimized beamsplitters for the most popular lasers used in fluorescence imaging, including newer all-solid-state lasers for conventional laser based microscopy such as confocal imaging. All beamsplitters in this category have exceptional reflectance at the laser wavelengths, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light. This dichroic beamsplitter is optimized for reflecting laser beams up to 2.5 mm in diameter while minimizing RWE.

Interested in an improved Flatness / RWE version? Consider Semrock's Super-resolution / TIRF dichroics:
1λ P-V RWE on 1mm Di03-R488/561-t1 , optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
λ/5 P-V RWE on 3mm Di03-R488/561-t3, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE
  • Price Not Available.
  • Each
    US Domestic pricing – contact your local distributor for other currency list prices
  • Price Not Available.
  • 555.00 USD Each
    US Domestic pricing – contact your local distributor for other currency list prices
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Optical Specifications Value
Transmission Band 1 Tavg > 93% 503.3 – 543 nm
Transmission Band 2 Tavg > 93% 582.4 – 800 nm
Reflection Band 1 Rabs > 94% 471 – 491 nm
Reflection Band 1 (p-pol) Rabs > 90% 471 – 491 nm
Reflection Band 1 (s-pol) Rabs > 98% 471 – 491 nm
Reflection Band 2 Rabs > 94% 559 – 568.2 nm
Reflection Band 2 (p-pol) Rabs > 90% 559 – 568.2 nm
Reflection Band 2 (s-pol) Rabs > 98% 559 – 568.2 nm
Edge Wavelength 1 500 nm
Edge Wavelength 2 575.5 nm
Laser Wavelengths 1 473 +/- 2 nm, 488 +3/-2 nm
Laser Wavelengths 2 559 +5/-0 nm, 561.4 nm, 568.2 nm
General Filter Specifications Value
Angle of Incidence 45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle 0.5 degrees
Optical Damage Rating 2 J/cm² at 532 nm (for a 532nm filter)
Flatness / RWE Classification   Laser
Reflected Wavefront Error < 6λ P-V RWE @ 632.8 nm
Steepness Steep
Physical Filter Specifications   Value
Transverse Dimensions (L x W) 25.2 mm x 35.6 mm
Transverse Tolerance ± 0.1 mm
Clear Aperture ≥ 80% (elliptical)
Scratch-Dig 60-40
Substrate Type Fused Silica
Filter Thickness (unmounted) 1.05 mm
Filter Thickness (unmounted) 1.05 mm
Filter Thickness Tolerance (unmounted) ± 0.05 mm
Filter Thickness Tolerance (unmounted) ± 0.05 mm
Orientation Reflective surface marked with part number - Orient in direction of incoming light
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Multiband Filter Set TerminologyCompares benefits and drawbacks of full multiband, pinkel and sedat filter sets
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

Specifications

TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Multiband Filter Set TerminologyCompares benefits and drawbacks of full multiband, pinkel and sedat filter sets
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

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