Optical Specifications
|
Value |
Transmission Band 1
|
Tavg > 93% 503.5 – 526.5 nm |
Transmission Band 2
|
Tavg > 93% 560 – 615.5 nm |
Transmission Band 3
|
Tavg > 93% 665.5 – 800 nm |
Reflection Band 1
|
Rabs > 94% 471 – 491 nm |
Reflection Band 1 (p-pol)
|
Rabs > 90% 471 – 491 nm |
Reflection Band 1 (s-pol)
|
Rabs > 98% 471 – 491 nm |
Reflection Band 2
|
Rabs > 94% 541.5 – 544.5 nm |
Reflection Band 2 (p-pol)
|
Rabs > 90% 541.5 – 544.5 nm |
Reflection Band 2 (s-pol)
|
Rabs > 98% 541.5 – 544.5 nm |
Reflection Band 3
|
Rabs > 94% 632.8 – 647.1 nm |
Reflection Band 3 (p-pol)
|
Rabs > 90% 632.8 – 647.1 nm |
Reflection Band 3 (s-pol)
|
Rabs > 98% 632.8 – 647.1 nm |
Edge Wavelength 1
|
499 nm |
Edge Wavelength 2
|
553 nm |
Edge Wavelength 3
|
658 nm |
Laser Wavelength 3
|
632.8 nm, 635 +7/-0 nm, 647.1 nm |
Laser Wavelengths 1
|
473 +/- 2 nm, 488 +3/-2 nm |
Laser Wavelengths 2
|
543.5 nm |
General Filter Specifications
|
Value |
Angle of Incidence
|
45 degrees with a shift of 0.35%/degree (40 – 50 degrees) |
Cone Half-angle
|
0.5 degrees |
Optical Damage Rating
|
2 J/cm² at 532 nm (for a 532nm filter) |
Reflected Wavefront Error
|
< 6λ P-V RWE @ 632.8 nm |
Steepness
|
Steep |
Flatness / RWE Classification
|
Laser |
Physical Filter Specifications
|
Value |
Transverse Dimensions (L x W)
|
25.2 mm x 35.6 mm |
Transverse Tolerance
|
± 0.1 mm |
Clear Aperture
|
≥ 80% (elliptical) |
Scratch-Dig
|
60-40 |
Substrate Type
|
Fused Silica |
Filter Thickness (unmounted)
|
1.05 mm |
Filter Thickness (unmounted)
|
1.05 mm |
Filter Thickness Tolerance (unmounted)
|
± 0.05 mm |
Filter Thickness Tolerance (unmounted)
|
± 0.05 mm |
Orientation
|
Reflective surface marked with part number - Orient in direction of incoming light |