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Researchers at the National Institute of Standards and Technology (NIST) have devised a calibration method that enables conventional microscopes to accurately measure the positions of points of light on a sample in all three dimensions. To develop their approach, the researchers took a problem that affects nearly all optical microscopes — lens aberrations — and used the effects of aberrations to allow precise and accurate tracking of single emitters in 3D throughout an ultrawide and deep field.
The researchers used intrinsic astigmatism and defocus, among other aberrations, to localize multiple emitters in 3D on an imaging substrate and on a complex microsystem, extending their concept to measurements of motion in six…READ MORE